Feng Guo research seminar

Feng Guo will be presenting his work at NIST this Monday Aug. 4 at 10:30 am in 220 Clark.
Spin waves at work: Imaging and Characterization of Magnetic Nanostructures
Abstract:
Many of the applications for magnetic nanotechnology depend on the ability to characterize the magnetic properties on the nanoscale. At NIST, we have been developing a ferromagnetic resonance force microscopy (FMRFM) facilitywith the goal of developing diagnostic measurements for practical devices. Conceptually, FMRFM may be regarded as a microwave spectrometer with a scanned probe detector, and it has the ability to “see” the ferromagnetic resonance spectra of buried structures. In the first example, I will describe the defect detection in an array by using spin wave resonance as a contrast mechanism. In another set of measurements, we investigate confined spin wave modes in patterned structures, and we demonstrate the ability to characterize the film edge properties. Throughout the talk I will attempt to emphasize the simple physics of the spin waves and its application to technological problems will be discussed in the context of developing scalable quantum information processing on a chip.