Feng Guo research seminar

Feng Guo will be presenting his work at NIST this Monday Aug. 4 at 10:30 am in 220 Clark.
Spin waves at work: Imaging and Characterization of Magnetic Nanostructures
Many of the applications for magnetic nanotechnology depend on the ability to characterize the magnetic properties on the nanoscale. At NIST, we have been developing a ferromagnetic resonance force microscopy (FMRFM) facilitywith the goal of developing diagnostic measurements for practical devices. Conceptually, FMRFM may be regarded as a microwave spectrometer with a scanned probe detector, and it has the ability to “see” the ferromagnetic resonance spectra of buried structures. In the first example, I will describe the defect detection in an array by using spin wave resonance as a contrast mechanism. In another set of measurements, we investigate confined spin wave modes in patterned structures, and we demonstrate the ability to characterize the film edge properties. Throughout the talk I will attempt to emphasize the simple physics of the spin waves and its application to technological problems will be discussed in the context of developing scalable quantum information processing on a chip.